- Category:
- LabView
- Tags:
-
[LabVIEW]
- File Size:
- 2.51mb
- Update:
- 2015-07-31
- Downloads:
- 1 Times
- Uploaded by:
- 张文辉
Description: IC image defect detection based on labview By matching obtain relative coordinates of the IC, and then found between each pin position obtained through the edge, and finally measuring the distance between each pin on IC defect type (bending/breaking, etc.)
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