Description: The SIFT feature detection algorithm has been invented and published by DavidLowe at the University of British Columbia. A detailed account of the completealgorithm is available at http://www.cs.ubc.ca/ ~ lowe/papers/ijcv03-abs.html
- [phonechecksystem] - no telephone inquiries interface is the
- [S51] - based on the S51 MCU C source code to le
- [siftpp-0.6.5] - sift algorithm. sift is a classic image
- [SIFT_fvs_REG] - This procedure using SIFT fingerprint re
- [SIFT] - This is the SIFT feature matching of tec
- [SIFT] - Extract images SIFT (scale-invariant) ch
- [SIFT] - Distinctive Image Features from Scale-In
- [libsift-1.8] - A sift splicing process, we take a look
- [sift] - Developed by a doctor from UCLA。 sift fe
- [demo_ASIFT_src] - Affine SIFT SIFT matching accuracy than
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