Description: the scheme of the tested circuits is extracted from the test
documents of FastScan, a tool of Automatic Test Pattern Generator of Mentor
Graphcis, and translated into a form processed by the compressing algorithm. The
paper proposes two methods for compressing tested pattern, one based on statistical
Huffman Code, the other based on differential Golomb code. Based on the function of
Mentor Graphics ATPG and the format of output file of the test pattern, the program
extracts and analyzes of the tested structure and data pattern familiar with typical
compressing algorithm and C/C++ developing environments, the program selects and
synthesizes the relevant optimal compressing algorithm, successfully compresses the
test pattern data related with the structural information, and implements the graphical
interactive interface and a report form of the result.
File list (Check if you may need any files):
| Filename | Size | Date |
|---|
| 测试模式提取及模式压缩软件设计 | huffman编码与Golomb码的比较.txt |
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