[Other resource] dengjianjuxianzhen

Description: 20 interval linear array of beam-forming process, with opportunity for the equivalent theorem into three array
Platform: | Size: 31483 | Author: 周勇 | Hits:

[Other resource] SHT11chinese

Description: This is the chip temperature = humidity of the information, it is necessary to look down! Look after you harvest it!
Platform: | Size: 102864 | Author: wiilingson | Hits:

[Other resource] PaymentManagement

Description: Salary management system. Complete wage information to add, modify functions.
Platform: | Size: 5356045 | Author: 孙永简 | Hits:

[Other resource] mcuconnect

Description: MCU use VHDL to improve the connection speed. On the MCU are interested in friends, it is worth downloading to see one.
Platform: | Size: 1285 | Author: 姚俊光 | Hits:

[Other resource] Exercice_1

Description: ATMEL contact the test procedure can experiment one, send one procedure
Platform: | Size: 1129 | Author: 王桃 | Hits:

[Other resource] SHT11english

Description: This is the chip temperature and humidity information in English, it is difficult to get to see it,
Platform: | Size: 800397 | Author: wiilingson | Hits:

[Other resource] Exercice_2

Description: ATMEL's can experiment contact test program 1, test program 2
Platform: | Size: 11320 | Author: 王桃 | Hits:

[Other resource] Exercice_3

Description: ATMEL contact the test procedure can experiment 1, testing procedures 3
Platform: | Size: 11703 | Author: 王桃 | Hits:

[Other resource] simpleexample3

Description: Using asp.net to develop an examination system, EC together into one, neat interface, beautiful, simple and convenient. In addition, the support by the permissions on the system to operate, that is, different types of us
Platform: | Size: 223138 | Author: 林宏 | Hits:

[Other resource] Exercice_4

Description: ATMEL contact the test procedure can experiment 1, testing procedures 4
Platform: | Size: 85996 | Author: 王桃 | Hits:

[Other resource] LM3S_Timer_16Bit_PWM

Description: ATMEL contact the AD experimental test procedure 1, test procedure 1
Platform: | Size: 9046 | Author: 王桃 | Hits:

[Other resource] main

Description: Abstract: This document is the AD testing laboratories the use of an external 22.1184MHz crystal, the JP3 jumper shorted* function: show boot
Platform: | Size: 3676 | Author: jayliu | Hits: