- Category:
- SCM
- Tags:
-
[C/C++]
[源码]
- File Size:
- 8kb
- Update:
- 2015-03-31
- Downloads:
- 0 Times
- Uploaded by:
- 夏春辉
Description: Test external interrupt 0 s and 1 low level trigger external interrupt, because K3 key on the experimental plate connected with the external interrupt 0 pins, K4 and MCU external interrupt 1 are linked together, the experimental test results are to be completed, press the K3 key, namely the external
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外部中断
........\waizhongduan.c
........\WAIZHONGDUAN.cof
........\WAIZHONGDUAN.dbg
........\WAIZHONGDUAN.hex
........\waizhongduan.lis
........\WAIZHONGDUAN.lk
........\WAIZHONGDUAN.lst
........\WAIZHONGDUAN.mak
........\WAIZHONGDUAN.mp
........\waizhongduan.o
........\waizhongduan.prj
........\WAIZHONGDUAN.SRC
........\waizhongduan._c
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