Title:
transistor-tester-based-on-LabVIEW
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Description: This paper introduces a design method of transistor characteristic tester based on NI LabVIEW and Beijing Junhetai Technology Co., Ltd. U18 data acquisition card, the content contains a circular scan data acquisition, blanking, multi curve display, transmission coefficient calculation, and gives details of the front panel and software block diagram and some test examples’ characteristic curves of transistor, MOS device, photoelectric coupler device etc.
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transistor tester based on LabVIEW.vi
