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[SCM] SDTest DL : 0: WinCE环境下检测SD卡序列号，编程环境： eVC4.0 + PPC2003。文件清单： newres.h ReadMe.txt Resource.h SDTest.aps SDTest.cpp SDTest.h SDTest.rc SDTest.vcc SDTest.vcl SDTest.vcp SDTestDlg.cpp SDTestDlg.h StdAfx.cpp StdAfx.h-WinCE environment Sequence Detection SD card, programming environment : eVC4.0 PPC2003. The list of documents : newres.h ReadMe.txt file Resource.h SDTest.aps SD Test.cpp SDTest.h SDTest.rc SDTest.vcc SDTes t.vcl SDTest.vcp SDTestDlg.cpp SDTestDlg.h S tdAfx.cpp StdAfx.h
Date : 2025-12-23 Size : 132kb User : water1974