本文介绍了众多的破解微控制器(MCU:Micro Control Unit)和智能卡(Smartcard)的方法： 包括已知的非侵入式攻击(Non-invasive attacks)，如功耗分析(Power analysis)和噪声干扰 (Glitching);以及侵入式攻击(Invasive attacks)，如反向工程(Reverse engineering)和微探测 分析(Microprobing)。现在已经有一种新的破解方法---半侵入式攻击(Semi-invasive attacks).和侵入式一样，它需要打开芯片的封装以接近芯片表面。但是钝化层(Passivation) 还是完好的，因为这种方法不需要与内部连线进行电接触。半侵入式攻击介于非侵入式与侵 入式之间，对硬件的安全是个巨大的威胁。它像侵入式一样高效，又像非侵入式一样廉价。 本文还介绍了实用的缺陷注入攻击法(Fault injection attacks)修改SRAM和EEPROM的 内容，或改变芯片上任意单个MOS管的状态。这几乎可以不受限制地控制芯片的运行和外围 保护部分。另一点是进行了数据保存期的实验，揭示了从已断电的SRAM和已擦除过的 EPROM，EEPROM和闪存芯片中读出数据的可行性。

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