Test external interrupt 0 s and 1 low level trigger external interrupt, because K3 key on the experimental plate connected with the external interrupt 0 pins, K4 and MCU external interrupt 1 are linked together, the experimental test results are to be completed, press the K3 key, namely the external

外部中断
........\waizhongduan.c
........\WAIZHONGDUAN.cof
........\WAIZHONGDUAN.dbg
........\WAIZHONGDUAN.hex
........\waizhongduan.lis
........\WAIZHONGDUAN.lk
........\WAIZHONGDUAN.lst
........\WAIZHONGDUAN.mak
........\WAIZHONGDUAN.mp
........\waizhongduan.o
........\waizhongduan.prj
........\WAIZHONGDUAN.SRC
........\waizhongduan._c

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