In predicting electrical tree growth behavior of practical insulation materials under operating voltages, one must consider the effects of mechanical tensile residual stresses, electrical field stresses and the voids distribution to the electrical tree growth. In this study a general model of electrical tree propagation is firstly proposed depend on voids location in the polymer, combines both the mechanical tensile residual stresses and the electrical field distribution in the medium using charge simulation method in combined with genetic algorithms to describe the local damage features around the tree tip, and enables this effect of compressive to predict the electrical tree dynamic growth. The obtained results have been assessed through comparison with available experimental data

A Prediction Methodology of Electrical Tree Propagation in Solid Dielectrics.pdf

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