the scheme of the tested circuits is extracted from the test documents of FastScan, a tool of Automatic Test Pattern Generator of Mentor Graphcis, and translated into a form processed by the compressing algorithm. The paper proposes two methods for compressing tested pattern, one based on statistical Huffman Code, the other based on differential Golomb code. Based on the function of Mentor Graphics ATPG and the format of output file of the test pattern, the program extracts and analyzes of the tested structure and data pattern familiar with typical compressing algorithm and C/C++ developing environments, the program selects and synthesizes the relevant optimal compressing algorithm, successfully compresses the test pattern data related with the structural information, and implements the graphical interactive interface and a report form of the result.

Filename	Size	Update
测试模式提取及模式压缩软件设计	huffman编码与Golomb码的比较.txt

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