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Description: 这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍，在此基础上，结合ARM7TDMI详细介绍了的JTAG调试原理。-This article introduces the ARM JTAG debugging basic tenets. The basic elements include the TAP (TEST PORT ACCESS) and BOUNDARY- SCAN ARCHITECTURE presentation on this basis, the combined ARM7TDMI details of the principles of JTAG debugging.
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Size: 453632 |
Author: 宋磊 |
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Description: 主要介绍 ARM JTAG调试的基本原理。基本的内容包括了 TAP 和 BOUNDARY-SCAN ARCHITECTURE-Introduces the basic principles of ARM JTAG debug. The basic elements include the TAP and BOUNDARY-SCAN ARCHITECTURE
Platform: |
Size: 453632 |
Author: ht |
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